Short Name:
syn
Instrument Type:
Diffraction (X-ray and electron)
Structural Science
Location:
KCL 11
Date of Acquisition:
January 2023
Description:
Copper and silver X-ray sources are available. The curved image plate detector allows high dynamic range and collection out to a 2Θ angle of 144 degrees in a single image to yield high-resolution single-crystal data.