Short Name:
SAXSWAXS
Instrument Type:
Diffraction (X-ray and electron)
Scattering
Solution Biophysics
Structural Science
Location:
SCL 26
Date of Acquisition:
December 2022
Description:
The Xeuss 3.0 offers a maximum flexibility of measurement configurations to get the best possible data quality on any type of sample.
In particular, the following key features enable the user to optimize experiments or results:
- High flux settings adapted for fast kinetics embedded in a low background camera
- Largest surface of detection moveable all the way from WAXS to long distance SAXS to optimize resolution and signal-to-noise
- Long distance SAXS settings for measuring large characteristic dimensions (up to 900 nm depending on the Xeuss 3.0 model)
- Optional USAXS module to characterize large structures ( > 2.5 µm)
Instrument Image:
